Modelling and kink correction of $0.18\,{{\bf \mu }}{m}$ 0.18 μ m bulk CMOS at liquid helium temperature

Zhen Li,Chao Luo,Tengteng Lu,Jun Xu,Weicheng Kong,Guoping Guo
DOI: https://doi.org/10.1049/el.2019.1099
2019-01-01
Electronics Letters
Abstract:Cryogenic characterisation and modelling of 0.18 μm CMOS technology (1.8 and 5 V) is presented in this Letter. Several P-type MOS and N-type MOS transistors with different width to length ratios were extensively characterised under various bias conditions at temperatures ranging from 300 K down to 4.2 K. The authors extracted their fundamental physical parameters and developed a compact model base...
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