Robust TE0 + TE1 Waveguide Crossing

Pengfei Xu,Yanfeng Zhang,Yujie Chen,Siyuan Yu
DOI: https://doi.org/10.1364/cleopr.2018.w3a.118
2018-01-01
Abstract:We proposed a silicon waveguide crossing device supporting both TE0 and TEl modes, TE0 mode insertion loss about -1 ~ -1.2 dB and TE1 insertion loss about -0.5 ~ -1 dB, and the crosstalk is better than -30 dB.
What problem does this paper attempt to address?