Dual-Layer Selector with Excellent Performance for Cross-Point Memory Applications

Qi Lin,Yi Li,Ming Xu,Qu Cheng,Hang Qian,Jinlong Feng,Hao Tong,Xiangshui Miao
DOI: https://doi.org/10.1109/led.2018.2808465
IF: 4.8157
2018-01-01
IEEE Electron Device Letters
Abstract:We demonstrate a CuS/GeSe dual-layer selector with excellent performance. This CuS/GeSe dual-layer selector exhibits ultrahigh selectivity (1.25 x 10(9)), high on-current drive (600 mu A), ultralow off current (similar to 100 fA), and extremely steep switching slope (<1.4 mV/dec). This selector shows significant threshold switching behavior by introducing CuS as the ion supply layer to implant limited Cu ions into GeSe layer, to form unstable filaments at high voltage and retract Cu ions at low voltage. In addition, Cu/GeSe devices were fabricated as a comparison, showing desirable memory switching. These two devices are of great potential for cross-point memory applications.
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