SoC Test Scheduling with Hot-Spot Avoidance and Even Heat Distribution

Jian Chen,Changhong Zhao,Dian Zhou,Xiaofang Zhou
DOI: https://doi.org/10.3321/j.issn:1003-9775.2006.01.008
2006-01-01
Abstract:An approach based on Bin-Packing algorithm and graph theory is proposed to avoid the hot-spot and distribute heat evenly on chip surface during test scheduling. First several parallel test sets (PTSs) are derived from graph models. Then Bin-Packing algorithm constructs an initial test schedule. A global optimal procedure gets the better test schedule finally. Experiments at results on ITC'02 benchmark SoCs show that this method can effectively avoid hot-spot and distribute heat evenly at the expense of a little percentage of test time.
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