Incremental Sequence Pair Generation Algorithm for SOC Test Scheduling

NIU Dao-heng,WANG Hong,YANG Shi-yuan
DOI: https://doi.org/10.3969/j.issn.1007-5321.2007.05.005
2007-01-01
Abstract:A deterministic algorithm is proposed for system-on-chip(SOC) test scheduling.Based on optimal assignment and balance design for test wrappers,four types of incremental sequence pair generation methods are constructed as a cyclic iteration process.By considering the test access mechanism(TAM) width,idle space, and test area for IP cores simultaneously,the algorithm can achieve effective solutions in certain iteration steps.Experimental results on ITC'02 benchmark show that the proposed algorithm performs faster than the traditional tabu search(TS)and ant colony optimization(ACO) based methods while obtaining comparable results.
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