Abstract:SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital electronic system because of its many inborn advantages.However, as manufacture of Integrated Circuit evolves towards Very Deep Sub-Micron technology, FPGA designers must be careful of circuit's Single Event Upset (SEU) susceptibility when used in hostile environment, such as avionics and space applications where reliability is vital.We proposed a SEU-fault emulation platform to evaluate circuit's SEU mitigation performance.The platform does not need any external circuit or micro controller to manage fault emulation process compared with existing approach.Source codes of Circuit Under Test (CUT) do not need to be modified or intruded with any component.It is a non-intrusive testing.Communication between host-computer and emulation board is minimized to accelerate fault injection speed.Experimental result shows that a single fault injecting (including Multi-Bits-Upset) only costs 29us.A circuit state reloading technology is exploited to increase emulation efficiency.Moreover, in the field of evolvable hardware, genetic operations can be reconfigured and its fitness can be evaluated on-line using the proposed fast dynamic reconfiguration method, which is useful for implementing self-repair and self-evolutionary hardware.

The Research of Test Method of FPGA Circuit Board based on Functional Modeling

Design and Realization of Boundary-scan Test Circuit for FPGA's Chip

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System

Design for HW/SW Co-Testing Based on FPGA

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

Method and system for testing on site programmable gate array

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

Boundary-scan Test Circuit Designed for FPGA

Research on Fault Mask in the Test of FPGA

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

Chip Tester Based on FPGA Commonly Used in Laboratory

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Study of Modeling of Built-in-self-test Technology for board-level circuit

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

Design and Implementation of the Testing Method for FPGA Chip Development

A Novel Automated FPGA Interconnect Test Algorithm

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

Study of Test Method Based on BIST for FPGA