Experiment on Ka-band Amplifiers Degraded and Damaged by Electromagnetic Waves

Zhan-Liang Wang,Jinjin Luo,Xu Xiong,Yu-Bin Gong,Yan-Yu Wei,Zhao-Yun Duan,Huarong Gong
DOI: https://doi.org/10.1049/joe.2018.0098
2018-01-01
Journal of Engineering
Abstract:Research on amplifiers injected by high-power microwave is important and lays foundation for reinforce technology. This study reports an experiment on Ka-band amplifiers injected and damaged by electromagnetic waves. The continuous wave and the pulse wave are injected into the amplifiers which are based on HMMC5040 chips. The injected power level increases until the amplifiers are damaged. The results are recorded and analysed. The results show that: (i) the uncharged amplifiers need more injected power to be damaged compared with the charged amplifiers. (ii) To degrade or damage the amplifiers, the pulse wave need more power. (iii) The first node of the HMMC5040 chip is damaged in the experiment, so this is the key part for anti-radiation design.
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