Investigation on conductive electromagnetic pulse (EMP) effects on the breakdown of GaAs MESFET-built power amplifiers (PA)

Liang Zhou,Liang Lin,Wei Luo,Wenyan Yin
DOI: https://doi.org/10.1109/EMCEurope.2012.6396757
2012-01-01
Abstract:Investigation on conductive electromagnetic pulse (EMP) effects on performance degradation and breakdown of GaAs MESFET-based power amplifiers (PA) are performed in this paper. One special measurement system is built, which consists of an adjustable EMP source, one controller, couplers, limiters, attenuators, one four-channel oscilloscope, and DUT. The PA performance degradation and electrothermal breakdown of its first-stage GaAs MESFET are observed and analyzed for the injected EMP with different widths, and its energy capabilities are characterized and studied in detail.
What problem does this paper attempt to address?