In-plane Schottky-barrier Field-Effect Transistors Based on 1 T /2 H Heterojunctions of Transition-Metal Dichalcogenides

Zhi-Qiang Fan,Xiang-Wei Jiang,Jun-Wei Luo,Li-Ying Jiao,Ru Huang,Shu-Shen Li,Wang
DOI: https://doi.org/10.1103/physrevb.96.165402
2017-01-01
Abstract:As Moore’s law approaches its end, two dimensional (2D) materials are intensely studied for their potentials as one of the “More than Moore’ (MM) devices. However, the ultimate performance limits and the optimal design parameters for such devices are still unknown. One common problem for the 2D material based device is the relative weak on-current. In this study, two dimensional Schottky-Barrier Field-Effect Transistors (SBFETs) consisted with in-plane hetero-junctions of 1T metallic-phase and 2H semiconducting-phase Transition-Metal Dichalcogenide (TMD) are studied following the recent experimental synthesis of such devices at much larger scale. Our ab initio simulation reveals the ultimate performance limits of such devices, and offers suggestions for better TMD materials. Our study shows that the Schottky-Barrier heights (SBH) of the in-plane 1T/2H contacts are smaller than the SBH of out-of-plane contacts, and the contact coupling is also stronger in the in-plane contact. Due to the atomic thickness of the mono-layer TMD, the average subthreshold swing (SS) of the in-plane TMD-SBFETs are found to be close to the limit of 60mV/dec, and smaller
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