Monolayer Molybdenum Disulfide Transistors with Single-Atom-Thick Gates.

Yibo Zhu,Yijun Li,Ghidewon Arefe,Robert A Burke,Cheng Tan,Yufeng Hao,Xiaochi Liu,Xue Liu,Won Jong Yoo,Madan Dubey,Qiao Lin,James C Hone
DOI: https://doi.org/10.1021/acs.nanolett.8b01091
IF: 10.8
2018-01-01
Nano Letters
Abstract:Two-dimensional transition-metal dichalcogenides (TMDs) are unique candidates for the development of next-generation electronic devices. However, the large contact resistance between metal and the monolayer TMDs have significantly limited the devices' performance. Also, the integration of ultrathin high-k dielectric layers with TMDs remains difficult due to the lack of dangling bonds on the surface of TMDs. We present monolayer molybdenum disulfide field-effect transistors with bottom local gates consisting of monolayer graphene. The atomic-level thickness and surface roughness of graphene facilitate the growth of high-quality ultrathin HfO2 and suppress gate leakage. Strong displacement fields above 8 V/nm can be applied using a single graphene gate to electrostatically dope the MoS2, which reduces the contact resistances between Ni and monolayer MoS2 to 2.3 k Omega.mu m at low gate voltages. The devices exhibit excellent switching characteristics including a near-ideal subthreshold slope of 64 millivolts per decade, low threshold voltage (similar to 0.5 V), high channel conductance (>100 mu S/mu m), and low hysteresis. Scaled devices with 50 and 14 nm channels as well as ultrathin (5 nm) gate dielectrics show effective immunity to short-channel effects. The device fabricated on flexible polymeric substrate also exhibits high performance and has a fully transparent channel region that is desirable in optical-related studies and practical applications.
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