Abstract:The reliability of nanoscale electronic systems is important in various applications. However, they are becoming increasingly vulnerable to atmospheric neutrons. This research conducted spallation neutron irradiations on a Xilinx Zynq-7000 system on a chip using the China Spallation Neutron Source. The results were analyzed in combination with a Monte Carlo simulation to explore the impact of atmospheric neutrons on the single event effects of the target system on chip. Meanwhile, the contribution of thermal neutrons to the chip's single event effect susceptibility was also assessed. It was found that absorbing thermal neutrons with a 2 mm Cd sheet can protect against the single event effect on the system on the chip by about 44.4%. The effects of B and Hf elements, inside the device, on a single event effect of the Xilinx Zynq-7000 system on chip were evaluated too. Additionally, it was discovered that 10B interacting with thermal neutrons was the primary cause of the thermal neutron-induced single event effect in the system on chip. Although Hf has a high neutron capture cross section, its presence does not significantly affect the sensitivity to single event effects. However, during atmospheric neutron irradiation, the presence of Hf increases the possibility of depositing the total dose in the tested chip.

Measurement of Single Event Effects Induced by Alpha Particles in the Xilinx Zynq-7010 System-on-Chip

Single Event Effects Testing of Xilinx Zynq-7010 SoC with 239Pu Alpha Irradiation

Single Event Effects Sensitivity of Low Energy Proton in Xilinx Zynq-7010 System-on Chip.

Investigation of Single Event Effect Susceptibility of Inner Memory Blocks in 28 nm Xilinx SoC Using <sup>239</sup>Pu

Analysis of Sensitive Blocks of Soft Errors in the Xilinx Zynq-7000 System-on-Chip

Neutron Irradiation Testing and Monte Carlo Simulation of a Xilinx Zynq-7000 System on Chip

Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip

Primary Single Event Effect Studies on Xilinx 28-Nm System-on-Chip (Soc)

Preliminary Single Event Effect Distribution Investigation on 28 Nm SoC Using Heavy Ion Microbeam

Single-event-effect Propagation Investigation on Nanoscale System on Chip by Applying Heavy-Ion Microbeam and Event Tree Analysis

Soft Error Evaluation and Vulnerability Analysis in Xilinx Zynq-7010 System-on Chip

Investigation of Single Event Effect in 28-Nm System-on-chip with Multi Patterns?

Single-event Effects Induced by Medium-Energy Protons in 28 Nm System-on-chip

Measurement of Neutron-induced Single Event Upset Cross-Section of UltraScale Kintex FPGA Using Time-of-Flight Technique

Experimental Studies of Single-Event Effects Induced by Heavy Ions

Electron-Induced Single-Event Effect in 28 nm SRAM-Based FPGA

Single Event Effect Detection and Simulation Analysis for an ASIC

Measurement of Single Event Effect cross section induced by monoenergetic protons on a 130 nm ASIC

Single event upset sensitivity of medium-energy proton in Xilinx 16nm MPSoC

Atmospheric Neutron Single Event Effect Test on Xilinx 28 Nm System on Chip at CSNS-BL09

Neutron-induced Single Event Effect in Xilinx 16nm MPSoC Configuration RAM (CRAM) Using White Neutron and 2.72~81.8mev Neutron in CSNS-BL20