The Influence of Fabrication Error in Ion Beam Rotation Etching on Uniform Illumination

徐俊中,赵逸琼,王炜,李永平,徐向东,周洪军,洪义麟,李涛,傅绍军
DOI: https://doi.org/10.3969/j.issn.1003-501X.2001.06.007
2001-01-01
Abstract:An ion beam rotation etching technique used for manufacture of diffractive optical elements with continuous relief structure is introduced in the paper. The simulation calculation for the influence of ion beam non-uniformity in the technological system and the alignment error between substrate and mask center on device properties is carried out. The process improvement scheme is proposed according to the simulation analysis for errors.
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