Effect of Boron Pre-Deposition on Size Distribution of Self-Assembled Ge Islands Fabricated by UHV/CVD

邓宁,黄文韬,王燕,罗广礼,陈培毅,李志坚
DOI: https://doi.org/10.3969/j.issn.1671-4776.2002.06.004
2002-01-01
Abstract:The effects of pre-deposition of boron with different B 2 H 6 flux on the self-assembled growth of Ge islands on Si (100)substrate by UHV/CVD are studied by atomic force microscopy(AFM).Quite uniform dome-shaped Ge quantum dots with size and height distribution of less than±3%,which is much more narrow than the size distribution of typical self-assembled Ge dots,are achieved after appropriate boron pre-deposition.The lateral size and height of these dots are60and10nm respectively and the density is about 8×10 9 cm -2 .The experimental results show that method of boron pre-deposition can be used to fabricate Ge quantum dots that are quite uniform meeting the requirements of opto-electronic devices.
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