Effects of phosphorous and antimony doping on thin Ge layers grown on Si
Xueying Yu,Hui Jia,Junjie Yang,Mateus G. Masteghin,Harvey Beere,Makhayeni Mtunzi,Huiwen Deng,Suguo Huo,Chong Chen,Siming Chen,Mingchu Tang,Stephen J. Sweeney,David Ritchie,Alwyn Seeds,Huiyun Liu
DOI: https://doi.org/10.1038/s41598-024-57937-8
IF: 4.6
2024-04-05
Scientific Reports
Abstract:Suppression of threading dislocations (TDs) in thin germanium (Ge) layers grown on silicon (Si) substrates has been critical for realizing high-performance Si-based optoelectronic and electronic devices. An advanced growth strategy is desired to minimize the TD density within a thin Ge buffer layer in Ge-on-Si systems. In this work, we investigate the impact of P dopants in 500-nm thin Ge layers, with doping concentrations from 1 to 50 × 10 18 cm −3 . The introduction of P dopants has efficiently promoted TD reduction, whose potential mechanism has been explored by comparing it to the well-established Sb-doped Ge-on-Si system. P and Sb dopants reveal different defect-suppression mechanisms in Ge-on-Si samples, inspiring a novel co-doping technique by exploiting the advantages of both dopants. The surface TDD of the Ge buffer has been further reduced by the co-doping technique to the order of 10 7 cm −2 with a thin Ge layer (of only 500 nm), which could provide a high-quality platform for high-performance Si-based semiconductor devices.
multidisciplinary sciences