Full in-plane strain tensor analysis using the microscale ring-core FIB milling and DIC approach

Alexander J.G. Lunt,Enrico Salvati,Lifeng Ma,Igor P. Dolbyna,Tee K. Neo,Alexander M. Korsunsky
DOI: https://doi.org/10.1016/j.jmps.2016.03.013
IF: 5.582
2016-01-01
Journal of the Mechanics and Physics of Solids
Abstract:Microscale Full In-plane Strain Tensor (FIST) analysis is crucial for improving understanding of residual stress and mechanical failure in many applications. This study outlines the first Focused Ion Beam (FIB) milling and Digital Image Correlation (DIC) based technique capable of performing precise, reliable and rapid quantification of this behaviour. The nature of semi-destructive FIB milling overcomes the main limitations of X-Ray Diffraction (XRD) strain tensor quantification: unstrained lattice parameter estimates are not required, analysis is performed in within a precisely defined 3D microscale volume, both amorphous and crystalline materials can be studied and access to X-ray/neutron facilities is not required.
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