A Digital Cds Technique and Its Performance Testing

Liu Xiao-Yan,Lu Jing-Bin,Yang Yan-Ji,Lu Bo,Wang Yu-Sa,Xu Yu-Peng,Cui Wei-Wei,Li Wei,Li Mao-Shun,Wang Juan,Han Da-Wei,Chen Tian-Xiang,Huo Jia,Hu Wei,Zhang Yi,Zhu Yue,Zhang Zi-Liang,Yin Guo-He,Wang Yu,Zhao Zhong-Yi,Fu Yan-Hong,Zhang Ya,Ma Ke-Yan,Chen Yong
DOI: https://doi.org/10.1088/1674-1137/39/7/076101
2014-01-01
Abstract:Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e(-) and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique.
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