Design and test results of a low-noise readout ASIC for pixelated CdZnTe detectors

LUO Jie,DENG Zhi,LIU Yinong,WANG Guangqi,LI Hongri
2012-01-01
Abstract:An 8-channel low noise front-end readout chip was designed to provide readouts from a highly pixelated cadmium zinc telluride(CdZnTe) detector.Each channel consists of a two-stage charge sensitive amplifier,a 4-th order semi-Gaussian shaper and an output buffer.The chip was fabricated in the 0.35 μm CMOS process.The channel gain is 65-260 mV/fC and the shaping time is 1-4 μs.The device has a minimum equivalent noise charge of 200e.The circuit and the CdZnTe detector gave an energy resolution of 9.6% for 241Am photopeaks and 5.9% for 57Co.The results show that this chip functions well with the measured noise in agreement with simulation results.The detector leakage current and the parasitic capacitance at the input significantly increase the electronic noise.
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