Enhanced Detectivity and Suppressed Dark Current of Perovskite-InGaZnO Phototransistor via PCBM Interlayer.

Xiaote Xu,Lizhi Yan,Taoyu Zou,Renzheng Qiu,Chuan Liu,Qing Dai,Jun Chen,Shengdong Zhang,Hang Zhou
DOI: https://doi.org/10.1021/acsami.8b16346
IF: 9.5
2018-01-01
ACS Applied Materials & Interfaces
Abstract:Hybrid phototransistors based on InGaZnO (IGZO) metal oxide thin film transistor (TFT) and photoabsorbing capping layer such as perovskite (MAPbI3) is a promising low-cost device for developing advanced X-ray and UV flat panel imager. However, it is found that the introduction of MAPbI3 inevitably damages the IGZO channel layer during fabrication, leading to deteriorated TFT characteristics such as off current rising and threshold voltage shift. Here, we report an effective approach for improving the performance of the perovskite-IGZO phototransistor by inserting a PCBM or PCBM:PMMA interlayer between the patterned MAPbI3 and the IGZO. The interlayer effectively prevents the IGZO from damaging by the perovskite fabrication process, while allowing efficient charge transfer for photo sensing. In this configuration, we have achieved a high detectivity (1.35 × 10^12 Jones) perovskite-IGZO phototransistor with suppressed off-state drain current (~10 pA) in the dark. This work points out the importance of interface engineering for realizing higher performance and reliable heterogeneous phototransistors.
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