Abstract:Time-based ADC is gaining popularity in medium-resolution high-speed (GS/s) analog-to-digital conversion, due to its capability to achieve faster conversion rates by scaling the time step T LSB through advanced process technology. The conversion speed (f s ) of an N-bit resolution TDC is primarily dominated by the T LSB , represented by f s $< 1/(2^{\mathrm{N}+1}\times \mathrm{T}_{\text{LSB}})$ . Several methods have been proposed to accelerate the speed by reducing T LSB . The vernier delay line design in [1] produces the T LSB by adjusting delay skew (T d1 -T d2 ). Ref. [2] utilizes phase interpolation to generate multi-phase clock outputs with uniform time intervals (1.375 ps). Additionally, the selective delay tuning cell [4] achieves a 500fs T LSB . These circuit implementations have enabled a significant reduction in T LSB . However, further reducing T LSB in traditional active inverter-based delay line of TDC poses several challenges: 1) The jitter budget of T LSB incorporates the random jitter (RJ) introduced by noise in voltage-to-time converter (VTC) and active delay line, as well as determination jitter (DJ) generated by the power supply ripple. In particular, the jitter budget should satisfy the bit error ratio (BER) requirement in communication system. 2) From the perspective of PVT variation calibration for T LSB , reducing T LSB requires higher calibration accuracy, leading to an increased complexity of the calibration circuit. 3) As the T LSB is reduced, a larger transconductance (gm) of input pair becomes critical for enhancing the precision of the dynamic time comparator. Consequently, this leads to an increase in power consumption, particularly during low slew-rate edge transitions.

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