Abstract:Time-based ADC is gaining popularity in medium-resolution high-speed (GS/s) analog-to-digital conversion, due to its capability to achieve faster conversion rates by scaling the time step T LSB through advanced process technology. The conversion speed (f s ) of an N-bit resolution TDC is primarily dominated by the T LSB , represented by f s $< 1/(2^{\mathrm{N}+1}\times \mathrm{T}_{\text{LSB}})$ . Several methods have been proposed to accelerate the speed by reducing T LSB . The vernier delay line design in [1] produces the T LSB by adjusting delay skew (T d1 -T d2 ). Ref. [2] utilizes phase interpolation to generate multi-phase clock outputs with uniform time intervals (1.375 ps). Additionally, the selective delay tuning cell [4] achieves a 500fs T LSB . These circuit implementations have enabled a significant reduction in T LSB . However, further reducing T LSB in traditional active inverter-based delay line of TDC poses several challenges: 1) The jitter budget of T LSB incorporates the random jitter (RJ) introduced by noise in voltage-to-time converter (VTC) and active delay line, as well as determination jitter (DJ) generated by the power supply ripple. In particular, the jitter budget should satisfy the bit error ratio (BER) requirement in communication system. 2) From the perspective of PVT variation calibration for T LSB , reducing T LSB requires higher calibration accuracy, leading to an increased complexity of the calibration circuit. 3) As the T LSB is reduced, a larger transconductance (gm) of input pair becomes critical for enhancing the precision of the dynamic time comparator. Consequently, this leads to an increase in power consumption, particularly during low slew-rate edge transitions.

A New Multilevel Interpolated TDC Method Based on a Two-Step Synchronizer

A Two-Step Time-to-Digital Converter with 5.6ps Resolution and 1 - 4255μs Measurement Range

A High Resolution Time-to-Digital Converter (TDC) Based on Self-Calibrated Digital-to-Time Converter (DTC).

A Two-Stage Interpolation Time-to-Digital Converter Implemented in 20 and 28 N·m FGPAs

Photonic-Assisted Time-Interleaved Adc Based on Optical Delay Line

A High-Resolution TDC Design Based on Multistep Fine Time Measurement by Utilizing Delay-Adjustable Looped Carry Chains on FPGAs

A high precision TDC based on a multi-phase clock

A 8bits, 6.2ps Resolution Two-Step Time-to-digital Converter with Set-Reset-based Arbiters and Signal Tracking Mechanism

A High-Resolution, High-Linearity, Two-Step Time-to-Digital Converter for Wideband Counter-Assisted ADPLL in 0.13um CMOS

A Three-Step Multi-Resolution Time-to-Digital Converter.

An Adaptive Downsampling FPGA-Based TDC Implementation for Time Measurement Improvement

A Low Complexity Timing Synchronization Algorithm for DTMB Standard

A low-power coarse-fine time-to-digital converter in 65nm CMOS

An Asynchronous Delay Line TDC for ADPLL in 0.13um CMOS.

A Wide Range and High Resolution Two-Step TDC for Millimeter-Wave Band ADPLL

A 3-step Low-latency Low-Power Multichannel Time-to-Digital Converter based on Time Residual Amplifier

A Fully Synthesizable Fractional-N MDLL with Zero-Order Interpolation-Based DTC Nonlinearity Calibration and Two-Step Hybrid Phase Offset Calibration

A 2.5ghz Adpll With Pvt-Insensitive Delta Sigma Dithered Time-To-Digital Conversion By Utilizing An Addll

A 5gs/s 38.04db SNDR Single-Channel TDC-Assisted Hybrid ADC with $\lambda/4$ Transmission Line Based Time Quantizer Achieving a PVT Robustness 416.6fs Time Step

A Dithered-Digital-Mixing Background Timing-Skew Calibration Method for Time-Interleaved ADCs

A Wideband Timing Mismatch Calibration Design for Time-Interleaved Analog-to-Digital Converters with Fast Convergence