Abstract:This paper proposes an all−digital calibration algorithm that utilizes a reference channel to suppress the timing mismatch in the Time−Interleaved Analog−to−Digital Converter (TIADC). The output of the reference channel is aligned with each sub−channel in turn, therefore enabling the simultaneous sampling and conversion of the same input signal. First, the statistical characteristics across the channels are employed for estimating the timing mismatch; then, by comparing the output difference between the reference channel and the sub−channels that are sampled simultaneously, the deviation of the derivator can be calibrated. Finally, combining both calibration results yields an accurate final output. This proposed algorithm provides an effective solution to improve TIADC performance in high−speed data acquisition systems. The proposed architecture is applied to a 12−bit 2.4 GS/s four−channel TIADC model, and then its effectiveness is verified. The simulation results exhibit that the Effective Number Of Bits (ENOB) at an input signal frequency of 984 MHz shows a remarkable improvement from 6.88 bits to 11.92 bits. The effectiveness of this technique is also demonstrated through the off−chip calibration of a commercial 12−bit four−channel 2 GS/s TIADC using a 680 MHz input signal that is based on the actual chip results.

A Wideband Timing Mismatch Calibration Design for Time-Interleaved Analog-to-Digital Converters with Fast Convergence

A Fast Combination Calibration of Foreground and Background for Pipelined ADCs

A Calibration Technique Based on Frequency-Domain Characteristics for Pipelined ADCs

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

Parallel background calibration with signal-shifted correlation for pipelined ADC

Modeling of digital background calibration with signal-dependent dithering for a 14-bit, 100-MS/s pipelined ADC

A Novel Autocorrelation-Based Timing Mismatch C Alibration Strategy in Time-Interleaved ADCs

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

An improved wide-range, low-complexity, fully-parallel digital background timing mismatch calibration method for dual-channel TIADC based on perfect reconstruction filter bank

A Maximum-Likelihood-Estimation-Based Digital Background Calibration Technique for Interstage Gain Error in Pipelined ADCs

An All−Digital Timing Mismatch Calibration Algorithm Based on Reference Channel for TIADC

The fast time-interleaved ADC channel mismatch calibration method based on equivalent sampling and dynamic reference point

A Background Timing Skew Calibration Technique In Time-Interleaved Adcs

A 14-Bit 200-Ms/s Time-Interleaved Adc with Sample-Time Error Calibration

A Dithered-Digital-Mixing Background Timing-Skew Calibration Method for Time-Interleaved ADCs

A Foreground Digital Calibration Algorithm for Time-Interleaved Adcs with Low Computational Complexity

Spectrum distribution‐based blind calibration method of mismatches for time‐interleaved ADCs

A Fast Converging Correlation-Based Background Timing Skew Calibration Technique by Digital Windowing for Time-Interleaved ADCs

A Mixed Sample-Time Error Calibration Technique in Time-Interleaved ADCs

An All-Digital Background Calibration Technique for M-Channel Downsampling Time-Interleaved ADCs Based on Interpolation

A Time-Spreading Calibration Technique for Multi-Bit/stage Pipeline ADCs