Investigation of nanopatterned c-plane sapphire Substrates for Growths of polar and nonpolar GaN epilayers

Yu-Sheng Lin,Kung-Hsuan Lin,Teddy Tite,Cho-Ying Chuang,Yu-Ming Chang,J. Andrew Yeh
DOI: https://doi.org/10.1016/j.jcrysgro.2012.03.040
IF: 1.8
2012-01-01
Journal of Crystal Growth
Abstract:The nanopatterned c-plane sapphire substrate with different morphologies can be successfully used to grow polar and nonpolar GaN epilayers. The nanopattern of sapphire substrate was prepared with natural lithography and dry-etching methods and the following GaN epilayer was grown by MOCVD. The GaN crystal orientation and crystalline quality were then characterized by high resolution X-ray diffraction, which reveals the GaN epilayer can be c-plane (0001) or m-plane (101̄0) orientation depending on the surface morphology of nanopatterned sapphire substrate. The corresponding full width at half maximum of the rocking curves for c- and m-plane GaN are 211 and 316arcsec, respectively. The rms surface roughness was measured to be 0.3nm by atomic force microscopy. The atomic structure of the sapphire-GaN heterointerface was studied by high resolution transmission electron microscope to reveal the growth mechanism. Furthermore, photoluminescence, time-resolved photoluminescence, and polarization Raman spectroscopy were employed to realize the optical and structural properties of these GaN epilayers.
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