Abstract:The refinement of interface structure in InGaAs/AlGaAs multiple quantum wells (MQWs) through molecular beam epitaxy (MBE) is crucial for enhancing their luminescence performance. The influencing mechanisms of the GaAs insertion layer (ISL) thicknesses on the interface structure and luminescence properties of InGaAs/AlGaAs MQWs were investigated by varying the GaAs ISL thickness variations and optimizing growth parameters. In our designed InGaAs/AlGaAs MQWs structures, GaAs ISL with thickness variables of 0 nm, 0.5 nm, 1 nm, 2 nm, and 4 nm were inserted between the interfaces of the InGaAs well layer and the AlGaAs barrier layer. Through experimental characterizations. The introduction of the GaAs ISL resulted in a gradual transition of the MQWs surface morphology from a three-dimensional (3D) island structure to a typical step-flow surface morphology, leading to the reduction in surface roughness and enhancement of hetero-interfaces quality. Moreover, the GaAs ISL with thickness exceeding 2 nm effectively inhibited the segregation of indium atoms, promoting the ordering of interface alloys and decreasing the polarization degrees from 3.76 % to 2.09 %. Temperature-dependent PL measurements indicated that the GaAs ISL could reduce interface defects and the density of non-radiative recombination centers, thereby enhancing the radiative recombination efficiency of MQWs and ultimately increasing the peak intensity of photoluminescence by 3.4 times. This work is significance for understanding the luminescent properties of InGaAs/AlGaAs MQWs, which provides reference highly efficient optoelectronic devices development.

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