Resistive Switching in BiFeO_3 -Based Heterostructures Due to Ferroelectric Modulation on Interface Schottky Barriers

Dongxia Chen,Aidong Li,Di Wu
DOI: https://doi.org/10.1007/s10854-014-2010-3
2014-01-01
Journal of Materials Science Materials in Electronics
Abstract:Ferroelectric BiFeO3 (BFO) thin films were deposited on (001) SrTiO3 substrates buffered with La0:7Sr0:3MnO3 (LSMO) electrodes. Bipolar resistive switching in Pt/BFO/LSMO heterostructures were observed with high stability and long retention. However, transport characteristics of Pt/BFO/LSMO is highly asymmetric and pronounced resistive switching can only be observed by applying negative reading pulses on the Pt top electrodes, i.e. when the Pt/BFO Schottky barrier is reverse-biased. This resistive switching is discussed in terms of a modulation on the Pt/BFO interface Schottky barrier by the polarization switching in ferroelectric BFO. Comparative studies on Pt/BFO/SrRuO3 and Pt/BFO/ LaNiO3 heterostructures reveal that the work function of the electrode materials and the formation of Schottky barriers are significant to the observed resistive switching behaviors.
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