Abstract:Grazing incidence X-ray diffraction (GIXRD), X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDX) are combined to investigate the microstructure and chemical composition of the surface layer in Cu(In, Ga)Se2 (CIGS) thin films deposited using a three-stage co-evaporation process. According to the GIXRD and micro-region electron diffraction analyses, ordered defect chalcopyrite (ODC) structure does not exist in the surface layer and the surface and the bulk region of the CIGS film have the similar crystal structure. However, the results from the EDX data show that the compositional ratios of the Cu/(In+Ga) (Cu/III) have a gradient distribution across the whole surface layer. The surface layer shows a Cu-poor compositional characteristics and the Cu content increases gradually from the surface to the bulk of the material. The compositional depth profiles determined by XPS agree very well with the results of the EDX measurements. The thickness of the surface layer has been determined to be about 50–100nm in consistence with that estimated from the compositional ratio of Cu/III. High density dislocations have been observed in the surface region of these samples by high resolution TEM analyses. Our results suggest that different compositions would induce different point defects in the surface layer.

Microstructure Characterization of the Soda-Lime-glass/copper–indium–gallium–selenium Interface in Cu-poor Cu(In,Ga)Se2 Thin Films

Increasing surface band gap of Cu(In,Ga)Se2 thin films by post depositing an In-Ga-Se thin layer.

Microstructural Characterization of Cu-poor Cu (in, Ga)Se2 Surface Layer

Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se 2 Films

Investigation of Cu(In,Ga)Se2 Polycrystalline Growth: Ga Diffusion and Surface Morphology Evolution

Enhancement of Hole Barrier and Light Absorption in the {112} Surface of CuIn0.5Ga0.5Se2Solar Cell

Investigation of Microstructural and Optical Properties of Cu(In, Al)Se-2 Thin Films with Various Copper Content

Structural Analysis of Cu(In1-Xgax)Se-2 Multi-Layer Thin Film Solar Cells

Preparation of Polycrystalline Cu(In,Ga)Se_2 Thin Film with Nano-metal Oxide:the Chemical Reaction Process and Its Properties

Synthesis and Characteristics of Cu(In,Ga)Se2 Thin Films from Nanoparticles by Solvothermal Method and Selenisation Process

Structural and Electrical Properties of Co-Evaporated In, Garich Cigs Thin Films

Structures, Optical Absorption and Electrical Properties of Pulsed-Laser-Deposited Cuin0.8ga0.2se2 Thin Films and Their Use in Cigs/Pcbm Photovoltaic Structures

Investigation of Microstructuring CuInGaSe2thin Films with Ultrashort Laser Pulses

Triangle islands and cavities on the surface of evaporated Cu(In, Ga)Se 2 absorber layer

Influences of the Selenization Temperature on the Microstructures and Chemical Compositions of CIGS/Mo Interface

Evolution of (in,ga)2se3 -Cu Rich -In(ga) Rich of CIGS Thin Films

Investigation of Copper Indium Gallium Selenide Material Growth by Selenization of Metallic Precursors

Preparation And Characterization Of Cu(In,Ga)Se-2 Thin Films By Selenization Of Cu0.8ga0.2 And In2se3 Precursor Films

Optoeletronic Investigation of Cu 2 ZnSn(S,Se) 4 Thin-Films & Cu 2 Zn Sn(S,Se) 4 /cds Interface with Scanning Probe Microscopy

Preparation of Cu(In,Ga)Se2 Thin Film by Sputtering from Cu(In,Ga)Se2 Quaternary Target

Impact of Various Cu Contents on Raman Spectra from Cu(In,Ga)Se2 Thin Films