Tensile strained Ge0.90Sn0.10 photodiode integrated with Si3N4 liner stressor for mid-infrared applications

qingfang zhang,yan liu,chunfu zhang,yue hao,genquan han
DOI: https://doi.org/10.1117/12.2199377
2015-01-01
Abstract:In this paper, tensile strained Ge0.90Sn0.10 photodiode with different architectures integrated with Si3N4 liner stressor for mid-infrared applications are theoretically investigated. Ge0.90Sn0.10 fin and waveguide photodiodes wrapped in the Si3N4 liner stressor are designed and the strain distribution is studied by the finite element simulation. A large tensile strain is induced in Ge0.90Sn0.10 with the Si3N4 liner stressor expanding. The energy band structure of tensile strained Ge0.90Sn0.10 is calculated using k.p theory. The direct bandgap E-g,E-Gamma of Ge0.90Sn0.10 under tensile strain is significantly reduced, which results in a large red shift of the cut-off wavelength of strained Ge0.90Sn0.10 devices. As the Si3N4 liner stressor expands by 1.5%, 25.1% and 48.7% reduction of E-g,E-Gamma are achieved in tensile strained Ge0.90Sn0.10 fin and waveguide photodiodes, respectively, compared to the unstrained device. The cut-off wavelengths of tensile strained Ge0.90Sn0.10 fin and waveguide devices are extended to 3.68 mu m and 5.37 mu m, respectively. Introducing tensile strain into GeSn by tensile strain liner stressor provides an effective method for extending the detection spectrum of GeSn photodiodes to mid-infrared wavelength, e. g. 5 mu m.
What problem does this paper attempt to address?