Chemical Bands Structure of Fluorinated Amorphous Carbon Films

XIAO Jian-rong,XU Hui,LI You-zhen,LIU Xiong-fei,MA Song-shan,JIAN Xian-zhong
DOI: https://doi.org/10.3321/j.issn:1004-0609.2005.10.019
2005-01-01
The Chinese Journal of Nonferrous Metals
Abstract:Fluorinated amorphous hydrogenated carbon(a-C∶F∶H) thin films were deposited by radio frequency plasma enhanced chemical vapor deposition(PECVD) reactor with CF_4 and CH_4 as source gases,at RF-power of 150W or 200W,and 100℃.The structure of the films was investigated by Raman spectroscopy,and it is found that the content of the hybrid-bonding configuration of sp~3 is more than that of sp~2.The component and chemical bands structure of the films were investigated by infrared(IR) absorption and X-ray photoelectron spectroscopy(XPS).The results of IR and XPS analysis suggest that the chemical bonding structures in the films are mainly C—F_x(x=1,2,3),C—H_2,C—H_3,C—C and unsaturated bonding of CC.The relative content of C—C—F is much more than that of the C—C—F_2 in these films.The chemical bonding structures change with different deposition power.
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