Solid-state qubit measurement with single electron transistors

hujun jiao,feng li,shikuan wang,xinqi li
DOI: https://doi.org/10.1063/1.3037144
2008-01-01
AIP Conference Proceedings
Abstract:In this paper we consider the continuous weak measurement of a solid-state qubit by single electron transistors (SET). For single-dot SET, we find that in nonlinear response regime the signal-to-noise ratio can violate the universal upper bound imposed quantum mechanically on any linear response detectors. We understand the violation by means of the cross-correlation of the detector currents. For double-dot SET, we discuss its robustness against wider range of temperatures, quantum efficiency, and the relevant open issues unresolved.
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