A Polydimethylsiloxane Electrophoresis Microchip with a Thickness Controllable Insulating Layer for Capacitatively Coupled Contactless Conductivity Detection

Junshan Liu,Fei Xu,Sifeng Wang,Zuanguang Chen,Jianbin Pan,Xinran Ma,Xiaokai Jia,Zheng Xu,Chong Liu,Liding Wang
DOI: https://doi.org/10.1016/j.elecom.2012.10.012
IF: 5.443
2012-01-01
Electrochemistry Communications
Abstract:A polydimethylsiloxane (PDMS) electrophoresis microchip with a thickness-controllable insulating layer for capacitatively coupled contactless conductivity detection is presented. A PDMS film is spin-coated on a glass slide with Pt microelectrodes to be the insulating layer, and then permanently bonded with a PDMS channel plate to make the whole microchip. The thickness of PDMS films can be precisely controlled down to submicrometers. With a microchip with a 0.6μm-thick PDMS insulating layer, a superior limit of detection (LOD) of 0.07μM for Na+ was obtained. For comparison, another two microchips with the same design but different insulating layer thicknesses (15μm and 50μm) were tested, and LODs were 1μM and 3μM respectively, which are almost two orders of magnitude higher. Moreover, the microchip detector also exhibited excellent linearity, reproducibilities and separation efficiencies.
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