Scanning-Tunneling-Microscopy of the Gaas(001) Surface-Morphology Prepared by Migration-Enhanced Epitaxy

QK XUE,JM ZHOU,T HASHIZUME,T SAKURAI
DOI: https://doi.org/10.1063/1.355743
IF: 2.877
1994-01-01
Journal of Applied Physics
Abstract:Employing field ion-scanning tunneling microscopy (FI-STM), we have studied the GaAs(001) surface prepared by the migration enhanced epitaxy (MEE) technique in a wide range of growth temperatures. The STM images clearly show the advantageous effect of enhanced Ga migration of MEE on the surface morphology of the GaAs(001) surface.
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