X-Ray Topographic Investigation of Dislocations in Czochralski-Grown Alexandrite (beal2o4cr) Single-Crystal

Q ZHANG,B HU,PZ DENG,FX GAN
DOI: https://doi.org/10.1088/0022-3727/26/4a/021
1993-01-01
Abstract:The arrangement of dislocations and their generation and propagation in [001]-oriented Czochralski-grown alexandrite (BeAl2O4:Cr) single crystals have been investigated by x-ray transmission topography. The dislocations observed in as-grown crystals lie on the (010) planes and are classified into two categories: (1) Grown-in dislocations mainly originating from three sources: (i) dislocations continued from those already present in the seed; (ii) dislocations nucleated at the seed-crystal interfaces and on the periphery of crystal cone; (iii) dislocations originating from inclusions. (2) Post-growth dislocations generated by glide or multiplication of grown-in dislocations.Most of the observed dislocations have their Burgers vector parallel to the [100] direction. The grown-in dislocations usually propagate along a path perpendicular to the local growth interface. Dislocations with Burgers vectors other than [100] form different angles with the local growth interface and proceed along different paths. The arrangement and density of dislocations in relation to the seed quality are also discussed.
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