Crystallization behavior and ferroelectric properties of PbTiO 3 /Ba 0.85 Sr 0.15 TiO 3 /PbTiO 3 sandwich thin film on Pt/Ti/SiO 2 /Si substrates
Shaobo Liu,Yanqiu Li,Meidong Liu
DOI: https://doi.org/10.1007/s11664-003-0092-4
IF: 2.1
2003-01-01
Journal of Electronic Materials
Abstract:A PbTiO 3 /Ba 0.85 Sr 0.15 TiO 3 /PbTiO 3 (PT/BST15/PT) sandwich thin film has been prepared on Pt/Ti/SiO 2 /Si substrates by an improved sol-gel technique. It is found that such films under rapid thermal annealing at 700°C crystallize more favorably with the addition of a PbTiO 3 layer. They possess a pure, perovskite-phase structure with a random orientation. The polarization-electric field (P-E) hysteresis loop and current-voltage (I-V) characteristic curves reveal that a PT/BST15/PT film exhibits good ferroelectricity at room temperature. However, no sharp peak, only a weak maximum, is observed in the curves of the dielectric constant versus temperature. The dielectric constant, loss tangent, leakage current density at 20 kV/cm, remnant polarization, and coercive field of the PT/BST15/PT film are 438, 0.025, 1.3 × 10 −6 Acm −2 , 2.46 µCcm −2 , and 41 kVcm −1 , respectively, at 25°C and 10 kHz. The PT/BST15/PT film is a candidate material for high sensitivity elements for uncooled, infrared, focal plane arrays (UFPAs) to be used at near ambient temperature.