The Bipolar Resistive Switching in BiFeO 3 Films

Qingyu Xu,Xueyong Yuan,Mingxiang Xu
DOI: https://doi.org/10.1007/s10948-011-1380-5
2011-01-01
Journal of Superconductivity and Novel Magnetism
Abstract:Pure-phase polycrystalline BiFeO 3 films have been successfully prepared by pulsed-laser deposition on surface oxidized Si substrates using LaNiO 3 buffer layer with substrate temperature ( T s ) ranging from 550 °C to 800 °C and a laser frequency of 5 Hz and 10 Hz. Bipolar resistive switching has been observed in all the films using LaNiO 3 as bottom electrodes and silver glue dots as top electrodes, the resistivity switches from a high-resistance state (HRS) to a low-resistance state (LRS) with positive voltage applied on the top Ag electrodes, and from LRS to HRS with positive voltage applied on the bottom LaNiO 3 electrodes. The mechanism of the resistive switching has been confirmed to be due to the voltage polarity dependent formation/rupture of the conducting filaments formed by the O vacancies. The highest resistive ratio of HRS to LRS, of more than 2 orders of magnitude, has been achieved in the highest resistive BiFeO 3 film prepared at T s of 650 °C and laser frequency of 10 Hz.
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