1.2 Kv Trench Insulated Gate Bipolar Transistors (igbt's) with Ultralow On-Resistance

F Udrea,SSM Chan,S Thomson,T Trajkovic,PR Waind,GAJ Amaratunga,DE Crees
DOI: https://doi.org/10.1109/55.778166
IF: 4.8157
1999-01-01
IEEE Electron Device Letters
Abstract:In this letter, we report the full development of 1.2 kV Trench IGBT's with ultralow on-resistance, latch-up free operation and highly superior overall performance when compared to state of the art IGBT's. The minimum forward voltage drop at the standard current density of 100 A/cm/sup 2/ was 1.1 V for nonirradiated devices and 2.1 V for irradiated devices. The maximum controllable current density was in excess of 1000 A/cm/sup 2/.
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