Improved electrical properties of bottom-gate mizo thin film transistors using oxygen and argon plasma treatment

Chun-Feng Hu,Ji-Yu Feng,Yan-Ping Deng,Xin-Ping Qu
DOI: https://doi.org/10.1109/ICSICT.2014.7021271
2014-01-01
Abstract:Both oxygen (O2) and argon (Ar) plasma treatments are carried out on the bottom-gate structured Mg-doped InZnO (MIZO) thin film transistors (TFTs) prepared by sol-gel method. It is found that the electrical properties of MIZO TFTS are greatly improved with the higher field effect mobility (μFE) and two orders of magnitude higher on/off current ratio under both kinds of plasma treatment.
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