Research on HVIGBT transient mixture model and parameter extraction method

gaohui feng,zhengming zhao,liqiang yuan,shiqi ji,jincheng zhao
DOI: https://doi.org/10.1109/ITEC-AP.2014.6940694
2014-01-01
Abstract:This paper presents a kind of HVIGBT transient mixture model and corresponding parameter extraction method. The HVIGBT model can divide into MOSFET and BJT two parts. The two models are formed respectively according to HVIGBT work principle, in addition, the carrier transport equations have been simplified for avoiding Kirk effect in BJT model. The transient model is realized in PSIM software in the paper. Extraction methods, which include estimation by empirical values, calculation by testing waveforms and comparison with same type models, are adopted in extracting model parameters. Through comparing testing and simulation waveforms, the model's simulation accuracy is proved.
What problem does this paper attempt to address?