Interface Circuit Of Sigma-Delta Accelerometer With On-Chip-Test Function

Xiaowei Liu,Honglin Xu,Chong He,Mingyuan Ren
DOI: https://doi.org/10.1587/elex.11.20140320
2014-01-01
IEICE Electronics Express
Abstract:A fifth-order fully differential interface circuit (IC) with on-chip-test function is presented to improve the noise performance for micromechanical sigma-delta (Sigma-Delta) accelerometer. The proposed onchip- test technique for Sigma-Delta accelerometers avoids a shaker table applying a sinusoidal signal as the simulated acceleration which involves distortion itself. An electrostatic force feedback linearization circuit is presented to reduce the harmonic distortion resulting in a larger dynamic range (DR). The post-simulation results show that the electrostatic force feedback linearization circuit decreases the harmonic distortion effectively and the proposed on-chip-test technique achieves 98 dB third-order harmonic distortion detection, and the nonlinearity of the proposed circuit is 0.02%.
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