Temperature Bias Drift Phase-Based Compensation for a MEMS Accelerometer with Stiffness-Tuning Double-Sided Parallel Plate Capacitors

Mingkang Li,Zhipeng Ma,Tengfei Zhang,Yiming Jin,Ziyi Ye,Xudong Zheng,Zhonghe Jin
DOI: https://doi.org/10.1007/s41871-023-00202-9
2023-01-01
Nanomanufacturing and Metrology
Abstract:This paper reports an approach of in-operation temperature bias drift compensation based on phase-based calibration for a stiffness-tunable MEMS accelerometer with double-sided parallel plate (DSPP) capacitors. The temperature drifts of the components of the accelerometer are characterized, and analytical models are built on the basis of the measured drift results. Results reveal that the temperature drift of the acceleration output bias is dominated by the sensitive mechanical stiffness. An out-of-bandwidth AC stimulus signal is introduced to excite the accelerometer, and the interference with the acceleration measurement is minimized. The demodulated phase of the excited response exhibits a monotonic relationship with the effective stiffness of the accelerometer. Through the proposed online compensation approach, the temperature drift of the effective stiffness can be detected by the demodulated phase and compensated in real time by adjusting the stiffness-tuning voltage of DSPP capacitors. The temperature drift coefficient (TDC) of the accelerometer is reduced from 0.54 to 0.29 mg/°C, and the Allan variance bias instability of about 2.8 μg is not adversely affected. Meanwhile, the pull-in resulting from the temperature drift of the effective stiffness can be prevented. TDC can be further reduced to 0.04 mg/°C through an additional offline calibration based on the demodulated carrier phase representing the temperature drift of the readout circuit.
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