Abstract:In advanced technology nodes, large timing margins must be added to allow for worse process, voltage, temperature, and aging variations. The error detection and correction (EDAC) technique effectively eliminates these margins by timing speculation, but the high design complexity and large hardware cost make many existing EDAC systems unsuitable for commercial processors. Based on the instruction-level locality of timing errors, a collaborative EDAC approach is proposed to address this issue. The hardware layer adopts simple and low cost EDAC circuits to ensure correct operation when timing error occurs, while a runtime software layer prevents recurring errors of the same instruction by sending timing error alarms to the hardware layer. Cooperation of both layers, accompanied with the proposed profile-guided timing error avoidance algorithm, eliminates more than 95% of errors with small runtime overhead. This significantly improves overall performance and alleviates pressure on the EDAC circuits. Experimental results based on the three-stage commercial CK802 processor in SMIC 40LL process present that the approach has improved the peak performance of the baseline EDAC system (Razor-Lite + half-frequency replay) by 8% and reduced the energy consumption by 25%, with less than 1.4% area overhead.

An on-chip frequency programmable test clock generation and application method for small delay defect detection

A Novel Multiphase Clock Generator Based on Digital DLL Designed for Oversampling in Transceiver

Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

Heterogeneous Static Timing Analysis with Advanced Delay Calculator

On-chip delay line based on selection network

An improved method for test chip design

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Eliminating Timing Errors Through Collaborative Design to Maximize the Throughput

A Random Delay Injection Based Clock Domain Crossing Verification Method

Novel delay-controllable clock buffer and its application

A Timing Failure Tolerance Design with In-Field Simultaneous Error Detection and Correction.

A New Timing-Driven Placement Algorithm Based on Table-Lookup Delay Model

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

Thermal-aware small-delay defect testing in integrated circuits

Test compaction for small-delay defects using an effective path selection scheme

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

A unified architecture for speed-binning and circuit failure prediction and detection

On-chip Clock Jitter Testing Circuit Based on Pulse-Shrinkage and Accumulation Register

Timing error resilient clock gate design for wide-voltage application