Abstract:Recent applications require vertical chip stacking to increase the performance of many devices without the need of advanced node components. Image sensors and vision systems will embed more and more smart functions, for instance, image processing, object recognition, and movement detection. In this perspective, the combination of Cu-to-Cu direct hybrid bonding technology with Through-Silicon-Via (TSV) will allow 3D interconnection between pixels and the associated computing and memory structures, each function fabricated on a separate wafer. Wafer-to-wafer hybrid bonding was achieved with multi-pitch design—1–4 μm—of single levels of Cu damascene patterned on 300 mm silicon substrates. Defect-free bonding, as far as the extreme edge of the wafer, was demonstrated on a stack with three wafers. Middle wafers thinning was done with grinding only and with a thickness uniformity (TTV) <2 μm to an ultimate thinning as low as 3 μm. Alignment performance was characterized by post-bonding for two superposed hybrid bonding interfaces. In our set of wafers, modeling the alignment with translation, rotation, and scaling components enables us to optimize the residuals down to 3σ < 100 nm. A process flow of thin TSV with a fine pitch of 2 μm for high-density vertical interconnect through a three-wafer stack was developed. Via-last TSV architecture was adopted with 1 μm TSV diameter and 10 μm thickness. Lithography, etching solutions, Ti/TiN barrier deposition, and void-free Cu filling solutions were demonstrated. TSV cross sections after CMP and connections with top and bottom Cu damascene lines show good profile control. Process developments are matured and can be reliably used in the fabrication of an electrical test vehicle including vertical interconnects associating multi-wafers stacking with a hybrid bonding process and high-density thin TSV applicable to low pitches (<5 μm).

Chip-to-wafer (C2W) 3D integration with well-controlled template alignment and wafer-level bonding

A Novel Chip-to-wafer (C2W) Three-Dimensional (3D) Integration Approach Using a Template for Precise Alignment

Development of low temperature Cu Cu bonding and hybrid bonding for three-dimensional integrated circuits (3D IC)

A Wafer-Level 3d Integration Using Bottom-Up Copper Electroplating And Hybrid Metal-Adhesive Bonding

Three-dimensional hybrid bonding integration challenges and solutions toward multi-wafer stacking

Multi-Chip 3D Integration Using Mechanical Interlock Bonding (MIB) Technology and Optimized TSV

A Novel Nontraditional Approach to C2W Cu/SiO2 Hybrid Bonding

Wafer-Level 3D Integration Based on Poly (Diallyl Phthalate) Adhesive Bonding

Wafer-to-Wafer Hybrid Bonding Development by Advanced Finite Element Modeling for 3-D IC Packages

Solid-State-Diffusion Bonding for Wafer-Level Fine-Pitch Cu/Sn/Cu Interconnect in 3-D Integration

Bottom-up Copper Electroplating Using Transfer Wafers for Fabrication of High Aspect-Ratio Through-Silicon-vias

A TSV Last Integration Approach with Wafer Level Pre-Patterned Adhesive Bonding

Cu-Based Thermocompression Bonding and Cu/Dielectric Hybrid Bonding for Three-Dimensional Integrated Circuits (3D ICs) Application

Reliability characterization of Chip-on-Wafer-on-Substrate (CoWoS) 3D IC integration technology

Low-temperature Cu/SiO2 Hybrid Bonding Using a Novel Two-Step Cooperative Surface Activation

Ultrastable 3D Heterogeneous Integration via N-Heterocyclic Carbene Self-Assembled Nanolayers

Recent Progress on Bumpless Cu/SiO2 Hybrid Bonding for 3D Heterogeneous Integration

Novel Cu-nanowire-based technology enabling fine pitch interconnects for 2.5D/3D Integration

Effective Analytical Placement for Advanced Face-to-Face-Bonded Circuit Designs.

Modelling and characterization on wafer to wafer hybrid bonding technology for 3D IC packaging

Enhanced Cu-to-Cu direct bonding by controlling surface physical properties