Comparative study of the structural, optical, and electrical properties of CuAlO 2 thin films on Al 2 O 3 and YSZ substrates via chemical solution deposition

H. F. Jiang,X. B. Zhu,H. C. Lei,G. Li,Z. R. Yang,W. H. Song,J. M. Dai,Y. P. Sun,Y. K. Fu
DOI: https://doi.org/10.1007/s10971-010-2348-9
2010-01-01
Journal of Sol-Gel Science and Technology
Abstract:Single-phase delafossite CuAlO 2 thin films are deposited successfully on Al 2 O 3 (001) and YSZ (100) substrates using the chemical solution method. X-ray diffraction data present that the CuAlO 2 film on the Al 2 O 3 (001) substrate is epitaxial, whereas that on YSZ (100) is c -axis oriented; the same is also demonstrated by the HRTEM images and SAED patterns. Optical transmittance spectra exhibit that both films have high transparency in the visible region. However, in this region, the optical transmittance of the CuAlO 2 thin film deposited on (001) Al 2 O 3 is inferior to that deposited on (100) YSZ. This optical anomaly can be attributed to surface scattering. Electrical transport measurements show that the resistivity of the film on (001) Al 2 O 3 is one order lower than that on (100) YSZ, suggesting that in-plane orientation is significant in improving hole mobility.
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