P-type Transparent Conducting Copper Aluminum Oxide Films with Different Cu/Al Ratio

ZHOU Qiang,JI Zhen-guo,ZHAO Li-na,CHEN Chen,WANG Chao
DOI: https://doi.org/10.3969/j.issn.1001-5868.2005.06.013
2005-01-01
Abstract:P-type transparent conducting copper aluminum oxide samples with different Cu/Al ratio were prepared by the sedimentation of cupric acetate and aluminum acetate at high temperature and solid-phase-reaction.X-ray diffraction results show that the powder samples consist of tenorite structured CuO,delafossite structured CuAlO_(2),spinel structured CuAl_(2)O_(4)and corundum structured Al_(2)O_(3).EDAX analysis indicate that the actual Cu/Al ratio in the samples increases with Cu/Al ratio in raw materials.Conducting type measurement results show that all the samples are p-type.The lowest and relative stable resistivity is obtained at the Cu/Al ratio of 1.0~1.5.
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