Abstract:PEDOT:PSS/Al2O3/n‐ZnO tri‐layer metal‐oxide–semiconductor structure on rigid ITO/glass substrate and flexible ITO/PET substrate are prepared and the effect of positive and negative piezo‐charges on the tunneling characteristics of metal‐oxide–semiconductor structures at forward and reverse bias is systematically investigated. This work provides an in‐depth understanding for the piezo‐phototronic effect on the Fowler–Nordheim tunneling mechanism. The piezo‐phototronic effect can modulate the dynamics of photo‐generated carriers by utilizing external‐strain–induced piezoelectric charges (piezo‐charges). Most of the current researches focus on the modulation effect on the optoelectronic properties of p–n junctions. There are only a few studies focusing on the metal‐oxide–semiconductor (MOS) structures. In this work, a PEDOT:PSS/Al2O3/n‐ZnO tri‐layer MOS tunneling junction is fabricated and the piezo‐phototronic effect on its photo‐carriers dynamic and performances is systematically investigated. The photoresponsivity to 365 nm laser illumination is reduced because of the negative piezo‐charges generated at the Al2O3/n‐ZnO interface. Meanwhile but unexpectedly, the similar phenomenon utilizing the positive piezo‐charges at the Al2O3/n‐ZnO interface is observed. The in‐depth working mechanisms are carefully investigated by analyzing the effect of piezo‐charges on the energy band diagram. Strain induced piezo‐charges could feasibly adjust the intermediate oxide layer's barrier height and width so that the tunneling effect can be efficiently modulated by the piezo‐phototronic effect, leading to the effective control over the MOS tunneling junction's photo‐carriers dynamic and corresponding photoresponses. This work provides an in‐depth understanding for the piezo‐phototronic effect on the MOS tunneling junction and provides guidance for the subsequent researches on the coupling of piezo‐phototronic effect and tunneling effect.

Bias-Induced Offset Effect Overlapped On Bipolar-Resistance Effect Based On Co/Sio2/Si Structure

Light-induced bipolar-resistance effect based on metal-oxide-semiconductor structures of Ti/SiO(2)/Si.

Bias-dependent Interface Roughening and Its Effect on Electric Bistability of Organic Devices

Magnetically Modulated Laser-Induced Resistance Effect Observed in Metal-Oxide-Semiconductor Structure of Cr/SiO(2)/Si.

Bipolar Resistance Effect Observed in CdSe Quantum-Dots Dominated Structure of Zn/CdSe/Si

Large Lateral Photovoltaic Effect and Spatial Resistance Effect on MoS2/p-Si Interface

Local Control of Exchange Bias by Resistive Switching

Body Bias Effects on the Single-Event-Transient Response of PDSOI Devices

Bias-induced insulator-metal transition in organic electronics

Local Control of Exchange Bias by Resistive Switching (phys. Status Solidi RRL 12/2018)

Dual Modulated Lateral Photoresistance Effect Observed on Silicon‐Based Discontinuous Copper Film

Using Laser to Modulate A Linear Resistance Change in Cu2o/Si Heteroepitaxial Junction

Van Der Waals Heterostructure Devices with Dynamically Controlled Conduction Polarity and Multifunctionality

Novel SiC/Si Heterojunction LDMOS with Electric Field Modulation Effect by Reversed L-shaped Field Plate

Self-Compensation Effect of Photo-Bias Instabilities in a-InGaZnO Thin-Film Transistors Induced by Unique Ion Migration

Substrate Biasing Effect in a High-Voltage Monolithically-Integrated GaN-on-SOI Half Bridge With Partial Recessed-Gate HEMTs

On the Photo‐Carriers Dynamic Regulation by Piezo‐Phototronic Effect in Metal‐Oxide–Semiconductor Tunneling Junction

Substrate Effect on Radiation-Induced Charge Trapping in Buried Oxide for Partially-Depleted SOI NMOSFET

Anomalous Negative Bias Temperature Instability Degradation Induced by Source/Drain Bias in Nanoscale Pmos Devices

Bias Dependence of Synergistic Radiation Effects Induced by Electrons and Protons on Silicon Bipolar Junction Transistors

Coaction And Distinguishment Of Converse Piezoelectric And Field Effects In La0.7ca0.3mno3/Srtio3/0.68pb(Mg1/3nb2/3)O-3-0.32pbtio(3) Heterostructures