Surface Plasmon Enhanced Electroluminescence of SiNx Film Based MIS Device

Changrui Ren,Dongsheng Li,Lu Jin,Lue,Deren Yang
DOI: https://doi.org/10.1109/group4.2010.5643405
2010-01-01
Abstract:Electroluminescence of MIS devices consisted with an ITO/SiO2/SiNx/Ag/p-Si/Al multilayer structure, as well as the multilayer without Ag, was investigated. The enhancement of EL intensity of MIS devices by introduce an Ag islands film was observed. Due to the existence of Ag islands film in the MIS devices of SiNx films, the injected current of MIS devices was increased and the extracted EL was also enhanced by the excitons-LSPs coupling.
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