Strain-modulated Valence Band Engineering for Enhancement of Surface Emission in Polar and Nonpolar Plane AlN Films

D. Y. Fu,R. Zhang,B. G. Wang,Z. Zhang,B. Liu,Z. L. Xie,X. Q. Xiu,H. Lu,Y. D. Zheng,G. Edwards
DOI: https://doi.org/10.1063/1.3136431
IF: 4
2009-01-01
Applied Physics Letters
Abstract:The k center dot p perturbation theory is adopted to calculate the strain-modulated excitonic transition energies and their polarization properties in c- and m-plane AlN. The two topmost valence subbands exchange their band characteristics at the degenerate point where epsilon(zz)=0.98% and epsilon(xx)=epsilon(yy)=-1.70%. The surface emission efficiency of c-plane AlN films can be dramatically enhanced with epsilon(zz)>0.98% (epsilon(xx)=epsilon(yy)<-1.70%), where the lowest excitonic transition is predominantly z-polarized. Besides, nonpolar plane (m- or a-plane) AlN experiencing anisotropic in-plane strain can be chosen as a candidate for enhancing the surface emission efficiency by proper strain manipulation.
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