Abstract:In this work, a new form of double Langmuir probe (DLP) system, an emissive double Langmuir probe (EDLP), which connects a collecting probe tip and an electron-emitting probe tip to form a DLP system, has been proposed as a replacement of the currently more common asymmetric double Langmuir probes (ADLPs). The EDLP was both computationally and experimentally investigated in this work. Using an emissive probe to provide an emission current I E to balance the electron collection current I C,e, the EDLP can obtain a full I–V trace when I E,TL > I C,es and be used in a similar manner to a single Langmuir probe with the exception that the EDLP, as with the ADLP, does not measure the local plasma potential. I E,TL ≫ I C,es can be realized on an EDLP without needing the much larger ion collection area required by the ADLP, and at I E,TL ∼ 2I C,es the relative error between the EDLP and a single Langmuir probe is ∼15% due to space-charge limited effects, which is better than that of the ADLP at ∼30% under similar conditions. The performance of an EDLP depends on whether its electron emission current sufficiently offsets its electron-collecting current, making it particularly fitting for scenarios where the plasma density is low but a large probe is difficult to employ due to the limited balancing ion current. This makes the EDLP potentially useful on satellites, which operate in very low temperature plasmas with a limited ion loss area to balance a Langmuir probe’s electron-collecting current. With the advances in highly emitting materials, EDLPs are expected to significantly remove the design barriers of Langmuir probes on satellites.

Diagnosis of Arc Ion Plating Plasma by Langmuir Double Probes

Langmuir Probe Diagnosis of DC Magnetron Sputtering Glow Discharge Plasma

Diagnosis of MPT Plume by Using Langmuir Probe

Double Flush-Mounted Probe Diagnostics and Data Analysis Technique for Argon Glow Discharge Plasma

DIAGNOSTIC OF RF PLASMA BY USING LANGMUIR PROBE AND ITS NUMERICAL PROCESSING

Measurement of the Electron Density of a Wind-Tunnel Plasma Using a Double Flush-Mounted Probe

Improved analysis techniques for cylindrical and spherical double probes

Plasma Diagnosis for Microwave Ecr Plasma Enhanced Sputtering Deposition of Dlc Films

Improved Double-Probe Technique for Spatially Resolved Diagnosis of Dual-Frequency Capacitive Plasmas

Parametric characterization of arcs in semi-sealed splitter plate DC circuit breakers

Flush-Mounted Probe Diagnostics for Argon Glow Discharge Plasma

A Self-Balanced Electron-Emissive Double Langmuir Probe Drawing No Electron Loss from Its Diagnosed Plasma

Langmuir Probe Diagnosis of a Cold Atmospheric Plasma Jet

Electric-probe Diagnostics for Plasma Configuration of Large-scale Magnetically Dispersed Arc Plasma

A 57-Pin Langmuir Probe Array for Two-Dimensional Diagnosis in the Toroidal KT-5D Steady-State Plasma

A Comparative Study of Single and Double Langmuir Probe Techniques for RF Plasma Characterization

Fast Diagnosis of Transient Plasma by Langmuir Probe

Diagnostics of tin droplet-based laser produced plasma by triple Langmuir probe

The Diagnostics of Rf Glow Discharge Plasma by A Probe and Its Data Process

Research on Low Pressure Electronic Density Diagnostic Method of Single Paperback Probe Based on Langmuir Probe Theory

Diagnosis of Radio Frequency Induced Plasma with Langmiur Probe and Spectrum