Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

Test Scheme of Soc Test with Multi-Constrained to Reduce Test Time

A Test Architecture for Test Reuse in SOC Design

SOC test architecture design for efficient utilization of test bandwidth

Challenges for Progress in Test and Design for Testability

A Microprocessor Based SOC Built-In Test Scheme

SOC Testing Methodology and Practice

Reconfigured Test Architecture Optimization For Tsv-Based Three-Dimensional Socs

Concurrent Core Test for SOC Using Shared Test Set and Scan Chain Disable

Testline: an Ieee P1500 Compatible Test Scheme for Soc Test

An Improved Test Access Mechanism Structure and Optimization Technique in System-on-chip

Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing

Cost-Effective Test Optimized Scheme of TSV-Based 3D SoCs for Pre-Bond Test

Implementation Method of SOC Concurrent Test Based on ATE

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

A JTAG Standard-based Test Circuit Design for SOC System

A scalable test mechanism and its optimization for test access to embedded cores

A SOC Test Circuit Design and Implement Based on JTAG

An improved method for test chip design

Reuse-Based SOC Test Integration and IEEE P1500 Standard

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores

Effective Design Method to Reduce SCAN Test Application Time of SOC's