Testing Large Curvature Surface of Optical Element with Spatial Carrier Heterodyne Interferometry

刘贱平,梁丽萍,金世龙,刘光灿
DOI: https://doi.org/10.3969/j.issn.1007-2276.2009.01.025
2009-01-01
Infrared and Laser Engineering
Abstract:The quality of optical element is directly influenced by the results of its surface test. A kind of test method of optical surface with large curvature by plane interferometer was studied. The measured surface error relative to the standard plane was obtained by some pivotal techniques such as interference fringe preprocessing, FFT phase distilling, phase unwrapping and the first Zernike polynomial fitting, then it subtracted the standard sphere appointed, so the measured surface error relative to the standard sphere appointed was obtained by reusing Zernike polynomial. On the basis, PV,RMS,N,△N of the measured surface error were calculated, the interference fringe formed by the measured surface relative to the standard sphere was successfully simulated. The method overcame the disadvantages of contact test with high precision. the σ of PV was better than λ/100 ,the σ of RMS was better than λ/700, and it could test random large curvature through the software. It provides a suitable method to test optical surface with big curvature radius.
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