A Stable Porous Silicon Dielectric Reflector with a Photonic Band Gap Centred at 10Μm

Zhang Jie,Xu Shao-Hui,Yang Shi-Qian,Wang Lian-Wei,Cao Zhi-Shen,Zhan Peng,Wang Zhen-Lin
DOI: https://doi.org/10.1088/0256-307x/25/4/042
2008-01-01
Abstract:By pulsed anodic etching at low temperature, we prepared a porous silicon reflector with a photonic band gap centred in the long-wavelength infrared spectral region (centred at about 12 mu m). After proper oxidation process, the stable reflector structure, which can reflect electromagnetic wave from 8 mu m to 12 mu m (centred at 10 mu m) within wide incidence angles (about 50 degrees), is obtained. The wavelength shift of absorption peak of Si-H and Si-O shows the influence of oxidation process and indicates the stability of oxidized porous silicon dielectric reflector, which offers possible applications for the room temperature infrared sensor.
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