Abstract:Random Ag-SiN films consisting of random small Ag particles embedded in a SiN thin film were deposited by radiant-frequency magnetron sputtering. Specimens orderly comprising a random Ag-SiN film and an optical phase change recording layer were exposed to a focused laser beam. It showed that, with a random Ag-SiN layer deposited above the recording layer, the ablation of the recording layer Occurred much faster and under much lower power than that of a single recording layer, which verified the local field enhancement of multiple scattering effects of the Ag particles. Finite Difference Time Domain (FDTD) calculation of a sandwiched structure consisting of ZnS-SiO2(130nm)/AgOx(20nm)/ZnS-SiO2(40nm) under a Gaussian beam irradiation has been carried out to simulate the near-field distribution in the structure. Near-field optical data storage adopting a Super-Resolution Near-field Structure (Super-RENS) usually utilizes similar films structure mentioned above to achieve super resolution storage density while that small Ag particles getting a high Carrier to Noise Ratio (CNR) at the same time. Many recent works have reported ,were formed in the AgOx film after converging laser irradiation onto the sandwiched structure. Here, another FDTD calculation was clone to simulate the same model except for that small Ag particles were modeled in the AgOx film in the center region of the incident laser spot. The results showed a huge local near-field enhancement, which indicates that, if the structure full of such small Ag particles are formed in a tiny region beyond the optical diffraction limit, the optical recording and readout out density would be improved as well as a high CNR level achieved due to the multiple scattering of the Ag particles.

Si Underlayer Induced Nano-Ablation In Aginsbte Thin Films

Multiple Scattering Effects of Ag Particles in Random Ag-Sin Film

Working mechanism of Sb thin films in super-resolution near-field structure

Laser Induced Surface Nanostructuring on Ultra-Thin Amorphous Si Films

Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors

Thermal diffusion and epitaxial growth of Ag in Ag/SiO2/Si probed by XRD, depth-resolved XPS, and slow positron beam

Laser Direct Writing Pattern Structures on Aginsbte Phase Change Thin Film

Laser Direct Writing of Ag Films from Solution on Si Substrate

Optical Properties And Static Recording Performances Of Ag-In-Te-Sb-O Films Using Short-Wavelength Laser

Multiple Scattering Effects of Ag Particles in Super-Resolution Near-field Structure

Annealing effect on SiNx/SiO2 superlattice with ultrathin sublayer fabricated using plasma-enhanced atomic layer deposition

Engineering Thermal Transport Within Si Thin Films: the Impact of Nanoslot Alignment and Ion Implantation.

Surface plasmons on Ag clusters induced via ultrasonic and thermal treatments and the enhancement of Si nanocrystal light emission

Direct Laser Writing Dry Lithography of High‐Resolution Micro‐/Nanostructures in AgSb4Te Thin Film for Tunable Perfect Absorber

Controlled synthesis of buried delta-layers of Ag nanocrystals for near-field plasmonic effects on free surfaces

Effects of Buffer Layer Thickness on the Surface Roughness of In0.3ga0.7as Thin Films: A Phase-Field Simulation

Effects Of Sputtering Parameters On The Optical Properties Of Aginsbte Phase-Change Film

An approach to obtain single layer of nanostructured Si by laser irradiation on ultrathin amorphous Si films

Crystallization dynamics of as-deposited amorphous AgInSbTe thin film induced by picosecond laser pulses

Thickness-Dependent NIR LSPR of Curved Ag/TiS2 Bilayer Film

Nano-ablation of Silica by Plasmonic Surface Wave at Low Fluence.